Secretariat: SACCommittee Manager:
Chairperson (until end 2024):Mr Jiang Zhao
ISO Technical Programme Manager [TPM]:ISO Editorial Manager [EM]:
- Creation date: 1991
Standardization in the field of microbeam analysis (measurement, parameters, methods and reference materials) which uses electrons as an incident beam and electrons and photons as the detection signal.
The purpose is to analyze the compositional and structural characteristics of solid materials. The volume of analysis will generally involve a depth up to 10 micrometers and a surface area less than 100 square micrometers.