ISO 14594:2014
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ISO 14594:2014
66542
No disponible en español

Estado : Publicado (Para revisar)

Esta norma será reemplazada por ISO/FDIS 14594
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Formato Idioma
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std 2 96 Papel
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Resumen

ISO 14594:2014 gives the general guidelines for the determination of experimental parameters relating to the primary beam, the wavelength spectrometer, and the sample that need to be taken into account when carrying out electron probe microanalysis. It also defines procedures for the determination of beam current, current density, dead time, wavelength resolution, background, analysis area, analysis depth, and analysis volume.

It is intended for the analysis of a well-polished sample using normal beam incidence, and the parameters obtained can only be indicative for other experimental conditions.

It is not designed to be used for energy dispersive X-ray spectroscopy.

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Informaciones generales

  •  : Publicado
     : 2014-10
    : Norma Internacional para revisar [90.92]
  •  : 2
     : 18
  • ISO/TC 202/SC 2
    71.040.50 
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