Reference number
ISO 13067:2020
© ISO 2024
International Standard
ISO 13067:2020
Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
Edition 2
2020-07
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Опубликовано (Версия 2, 2020)

ISO 13067:2020

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CHF 129
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Тезис

This document describes procedures for measuring average grain size derived from a two-dimensional polished cross-section using electron backscatter diffraction (EBSD). This requires the measurement of orientation, misorientation and pattern quality factor as a function of position in the crystalline specimen[1]. The measurements in this document are made on two dimensional sections. The reader should note carefully the definitions used (3.3) which draw a distinction between the measured sectional grain sizes, and the mean grain size which can be derived from them that relates to the three dimensional grain size.

NOTE 1 While conventional methods for grain size determination using optical microscopy are well-established, EBSD methods offer a number of advantages over these techniques, including increased spatial resolution and quantitative description of the orientation of the grains.

NOTE 2 The method also lends itself to the measurement of the grain size of complex materials, for example those with a significant duplex content.

NOTE 3 The reader is warned to interpret the results with care when attempting to investigate specimens with high levels of deformation.

Общая информация

  • Текущий статус
     : Опубликовано
    Дата публикации
     : 2020-07
    Этап
    : Опубликование международного стандарта [60.60]
  • Версия
     : 2
  • Технический комитет :
    ISO/TC 202
    ICS :
    71.040.50 
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