Reference number
ISO/TS 17915:2013
© ISO 2024
Technical Specification
ISO/TS 17915:2013
Optics and photonics — Measurement method of semiconductor lasers for sensing
Edition 1
2013-07
Withdrawn
Withdrawn (Edition 1, 2013)

Abstract

ISO/TS 17915:2013 describes methods of measuring temperature, injected current dependence and lasing spectral line width in relation to semiconductor lasers for sensing applications. ISO/TS 17915:2013 is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields. ISO/TS 17915:2013 is an application of ISO 13695, in which the physical bases are explained.

General information

  • Status
     : Withdrawn
    Publication date
     : 2013-07
    Stage
    : Withdrawal of International Standard [95.99]
  • Edition
     : 1
    Number of pages
     : 27
  • Technical Committee :
    ISO/TC 172/SC 9
    ICS :
    31.260 
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