ISO 19830:2015

Published (Edition 1, 2015)

This standard was last reviewed and confirmed in 2021. Therefore this version remains current.

ISO 19830:2015

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Abstract

ISO 19830:2015 Standard is to define how peak fitting and the results of peak fitting in X-ray photoelectron spectroscopy shall be reported. It is applicable to the fitting of a single spectrum or to a set of related spectra, as might be acquired, for example, during a depth profile measurement. This International Standard provides a list of those parameters which shall be reported if either reproducible peak fitting is to be achieved or a number of spectra are to be fitted and the fitted spectra compared. This International Standard does not provide instructions for peak fitting nor the procedures which should be adopted.

General information

Status
: Published

Publication date
: 2015-11

Stage
: International Standard confirmed [90.93]
Edition
: 1

Number of pages
: 22
Technical Committee :
ISO/TC 201/SC 7

ICS :
71.040.40
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