Reference number
ISO 21222:2020
International Standard
ISO 21222:2020
Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
Edition 1
2020-01
Read sample
ISO 21222:2020
70110
Published (Edition 1, 2020)

ISO 21222:2020

ISO 21222:2020
70110
Language
Format
CHF 96
Convert Swiss francs (CHF) to your currency

Abstract

This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.

General information

  •  : Published
     : 2020-01
    : International Standard published [60.60]
  •  : 1
     : 17
  • ISO/TC 201/SC 9
    71.040.40 
  • RSS updates

Got a question?

Check out our Help and Support