ISO/AWI 12179
Geometrical product specifications (GPS) — Surface texture: Profile method — Calibration of contact (stylus) instruments
Reference number
ISO/AWI 12179
Edition 3
© ISO 2024
Working draft
Under development
A working group has prepared a draft.
Will replace ISO 12179:2021

Abstract

This document specifies the calibration and adjustment of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration and adjustment is intended to be carried out with the aid of measurement standards.

Annex B specifies the calibration and adjustment of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.

General information

  • Status
     : Under development
    Stage
    : New project registered in TC/SC work programme [20.00]
  • Edition
     : 3
  • Technical Committee :
    ISO/TC 213
  • RSS updates

Life cycle

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