Reference number
ISO 18114:2021
ISO 18114:2021
© ISO 2024
International Standard
ISO 18114:2021
Surface chemical analysis — Secondary-ion mass spectrometry — Determination of relative sensitivity factors from ion-implanted reference materials
Edition 2
2021-05
2021-05
Résumé
This document specifies a method of determining relative sensitivity factors (RSFs) for secondary-ion mass spectrometry (SIMS) from ion-implanted reference materials.
The method is applicable to specimens in which the matrix is of uniform chemical composition, and in which the peak concentration of the implanted species does not exceed one atomic percent.
Informations générales
-
État actuel: PubliéeDate de publication: 2021-05Stade: Norme internationale publiée [60.60]
-
Edition: 2
-
Comité technique :ISO/TC 201/SC 6ICS :71.040.40
- RSS mises à jour
Cycle de vie
-
Précédemment
AnnuléeISO 18114:2003
-
Actuellement
